Preface to Third Edition.
Appendix 1. Review Questions.
Goodreads helps you keep track of books you want to read. Uh-oh, it looks like your Internet Explorer is out of date. Weitere Versionen. Mohit marked it as to-read Nov 17, Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. Optical Characterization. Charge-Based and Probe Characterization.
Appendix 2. Appendix 3. Appendix 4.
Appendix 5. Appendix 6. Appendix 7.
Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and.
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Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.
Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.